主要性能指標
低時基抖動:
8 條同時采集的通道上典型值為 425 fs
82A04B 相位基準模塊中，最多 6 條通道上 <100 fs
垂直分辨率 – 16 位模數(shù)轉(zhuǎn)換器
電接口分辨率：<20 µV LSB（適用于 1 v 全量程）
光接口分辨率從 80C07B（1 mW 全量程）的 <20 nW 到 80C10C（30 mW 全量程）的 <0.6 µW
光接口帶寬 >80 GHz
電接口帶寬 >70 GHz
為 NRZ、RZ 和脈沖信號類型提供了超過 120 種自動測量功能
80 多種行業(yè)標準模板，自動進行模板測試
復雜抖動/噪聲/BER/SER 分析 (80SJNB)，支持復雜測量 TDECQ 1, SNDR 2 (應用)
1PAM4 發(fā)射機和色散眼圖閉合象限。
2S信噪失真比。
主要特點
各種光接口模塊、電接口模塊和附件模塊可以滿足您的特定測試要求。
光接口模塊
支持從 155 Mb/s 到 10 Gb/s、40 Gb/s、100 Gb/s 和 50G/100G/200G/400G PAM4 光數(shù)據(jù)速率的光模塊
光基準接收機(ORR) 1 滿足了標準規(guī)定的一致性測試中的要求
光接口采樣模塊提供了高光學靈敏度、低噪聲及寬動態(tài)范圍，可以準確地測試和檢定短程到遠程光接口通信標準
經(jīng)過全面校準的時鐘恢復解決方案 – 不需要手動校準數(shù)據(jù)撿拾損耗
已校準消光比測量和變量校正 ER 測量可確保精度和重復能力
電接口模塊
超低噪聲電采樣器（20GHz 時 280 μV，60GHz 時 450 μV，典型值）
可以選擇帶寬2，用戶可以平衡帶寬和噪聲，實現(xiàn)優(yōu)秀的數(shù)據(jù)采集性能
遠程采樣器或緊湊的采樣擴展器模塊電纜限度地減少信號劣化，因為采樣器可以放在被測器件附近
高性能集成 TDR（10 ps 典型步進上升時間）支持杰出的阻抗不連續(xù)性檢定，對帶寬高達 50GHz 的 S 參數(shù)測量提供了高動態(tài)范圍
分析
對速率在 <1 GBd 到 60 GBd 之間的高速 PAM4 和 PAM2 NRZ 串行數(shù)據(jù)執(zhí)行抖動、噪聲和 BER 分析，了解眼圖閉合的確切原因
分析 PAM4 信號，全面分析每一個 PAM 眼圖的抖動、噪聲和 BER，并支持一套全局測量，評估 PAM4 信號整體屬性
100G-SR4/發(fā)射機和色散眼圖閉合 (TDEC) 自動化提供對 SR4 短程以太網(wǎng)至關重要的 TX 光屬性的全套測試和調(diào)試
80STDEC 簡化了高性能發(fā)射機和色散眼圖閉合 (TDEC) 測量，使其非常適合生產(chǎn)和一致性驗證應用
自動模板測試，支持 80 多種行業(yè)標準模板。新模板可以導入 DSA8300，支持各種新興標準。用戶可以定義自己的模板，自動進行模板測試
抖動、噪聲、BER、模板測試和串行數(shù)據(jù)鏈路分析 (SDLA) 通過 80SJNB Essentials 和 Advanced 應用軟件選項提供
高級 TDR 分析、S 參數(shù)測量、仿真模型提取和串行鏈路仿真功能通過 IConnect® 應用軟件選項提供
400G-M4 光制造分析軟件提供了光發(fā)射機和色散眼圖閉合象限(TDECQ)分析功能
高測試吞吐量
每條通道高達 200 kS/s 的高采樣率
高效編程接口（IEEE-488、以太網(wǎng)或本地處理器接入）實現(xiàn)高測試吞吐量
1光基準接收機(ORR)是一種四階 Bessel-Thompson 濾波器，擁有標準規(guī)定的頻響和容限。泰克優(yōu)化了響應，實現(xiàn)標稱擬合和高質(zhì)量的模板測試結(jié)果。
2參閱 80E00 電采樣模塊產(chǎn)品技術資料，獲得每種模塊的詳細介紹。
應用
設計/檢驗電信和數(shù)據(jù)通信器件和系統(tǒng)
ITU/ANSI/IEEE/SONET/SDH 制造/一致性測試
高性能真正差分 TDR 測量
串行數(shù)據(jù)應用阻抗檢定和網(wǎng)絡分析，包括 S 參數(shù)
高級抖動、噪聲、BER和SDLA分析
使用IConnect基于通道和眼圖仿真和測量建模
杰出的性能，優(yōu)異的通用性
DSA8300 數(shù)字串行分析儀為開發(fā)和測試采用幾千兆位數(shù)據(jù)傳輸技術的通信、計算機和消費電子提供了用途廣泛的工具。它可以用來對這些產(chǎn)品中使用的器件、模塊和系統(tǒng)的光接口和電接口發(fā)射機進行檢定及一致性驗證。
此外，DSA8300 特別適合電接口信號路徑檢定，包括封裝、PCB 或電纜。由于杰出的帶寬、信號保真度及可擴展性的模塊化架構(gòu)，DSA8300 為當前和新興串行數(shù)據(jù)技術提供了性能的 TDR 和互連分析能力、準確的信號損傷分析能力以及 BER 計算功能。
Key performance indicators
Low base jitter:
The typical value on the maximum 8 simultaneous acquisition channels is 425 fs
In 82A04B phase reference module, <100 fs on up to 6 channels
Vertical resolution - 16 bit AD converter
Electrical interface resolution: <20 V LSB (suitable for 1 V full range)
The optical interface resolution ranges from <20 nW at 80C07B (1 mW full range) to <0.6 W at 80C10C (30 mW full range)
Optical interface bandwidth >80 GHz
Electrical interface bandwidth >70 GHz
More than 120 automatic measurement functions are provided for NRZ, RZ and pulse signal types
More than 80 industry standard templates, automatic template testing
Complex jitter/noise /BER/SER analysis (80SJNB), support complex measurement TDECQ 1, SNDR 2 (application)
Pam4 transmitter and dispersion eye diagram closed quadrant.
2S SNR.
The main features
Various optical interface modules, electrical interface modules and accessories modules can meet your specific test requirements.
Optical interface module
PAM4 supports light modules ranging from 155 Mb/s to 10 Gb/s, 40 Gb/s, 100 Gb/s, and 50G/100 g /200G/400G PAM4 light data rates
Optical reference receiver (ORR) 1 meets the requirements specified in the conformance test specified in the standard
Optical interface sampling module provides high optical sensitivity, low noise and wide dynamic range, which can accurately test and verify short-range to long-range optical interface communication standards
Fully calibrated clock recovery solution - no manual calibration data collection loss required
Calibrated extinction ratio measurements and variable correction ER measurements ensure accuracy and repeatability
Electrical interface module
Ultra-low noise electrical sampler (280 V at 20GHz, 450 V at 60GHz, typical values)
Bandwidth 2 can be selected. Users can balance bandwidth and noise to achieve excellent data acquisition performance
Remote sampler or compact sampler expander module cable minimizes signal degradation because the sampler can be placed near the device under test
High performance integrated TDR (10 ps typical step rise time) supports outstanding impedance discontinuity verification, providing a high dynamic range for S parameter measurements with bandwidth up to 50GHz
Analysis of the
Jitter, noise and BER analysis were performed on high-speed PAM4 and PAM2 NRZ serial data with a rate between <1 GBd and 60 GBd to understａnd the exact cause of eye pattern closure
PAM4 signal is analyzed, the jitter, noise and BER of each PAM eye image are comprehensively analyzed, and a set of global measurement is supported to evaluate the overall properties of PAM4 signal
The 100g-sr4 / transmitter and dispersion eye pattern closure (TDEC) automation provides a full suite of testing and debugging of the TX attributes critical to SR4 short-range Ethernet
The 80STDEC simplifies high performance transmitter and dispersion eye pattern closure (TDEC) measurements, making it ideal for production and consistency verification applications
Automatic template testing, support more than 80 industry standard templates. The new template can be imported into DSA8300, supporting various emerging standards. Users can define their own templates, template testing automatically
Jitter, noise, BER, template testing, and serial data link analysis (SDLA) are provided with 80SJNB Essentials and Advanced application software options
Senior TDR analysis, extraction and serial links S parameter measurement, the simulation model simulation function through IConnect ® options provide application software
The 400g-m4 optical manufacturing analysis software provides optical transmitter and dispersion eye diagram closed quadrant (TDECQ) analysis functions
High test throughput
Each channel has a high sampling rate of up to 200 kS/s
Efficient programming interfaces (ieee-488, Ethernet, or local processor access) achieve high test throughput
The optical reference receiver (ORR) is a four - order Bessel-Thompson filter with standard frequency response and tolerances. Tektronix optimizes the response to achieve nominal fit and high quality template test results.
Refer to 80E00 electrical sampling module product technical data for detailed introduction of each module.
application
Design/test telecommunication and data communication devices and systems
ITU/ANSI/IEEE/SONET/SDH manufacturing/conformance testing
High performance real differential TDR measurement
Impedance verification and network analysis are applied to the serial data, including S parameters
Advanced jitter, noise, BER and SDLA analysis
IConnect was used for channel - and eye-based simulation and measurement modeling
Excellent performance, excellent versatility
The DSA8300 digital serial analyzer provides a wide range of tools for developing and testing communications, computers and consumer electronics using thousands of megabits of data transmission technology. It can be used for verification and consistency verification of optical and electrical interface transmitters of devices, modules and systems used in these products.
In addition, the DSA8300 is particularly suitable for electrical interface signal path verification, including encapsulation, PCB or cable. Due to the outstanding bandwidth, signal fidelity and scalability of the leading modular architecture, DSA8300 for the current and emerging serial data technology provides super performance TDR and interconnection analysis capabilities, accurate signal damage analysis capabilities and BER computing functions.
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